ATE
Automatic Test Equipment (ATE)
Automatic Test Equipment (ATE) Introduction Within the intricate web of semiconductor production, there'…
Automatic Test Equipment (ATE) Introduction Within the intricate web of semiconductor production, there'…
Fault Simulation Fault simulation is a method in which we try to insert actual fault value at the fault site,…
Fault collapsing In an ATPG process, once a fault has been detected it has to be dropped from the list of f…
Automatic Test Pattern Generation (ATPG) What is ATPG? Test pattern generation (TPG) is the process of gener…
Pattern Generation In DFT , a manufacturing defect, whether it is due to Stuck-at , bridging , switching , o…
DFT Techniques | Scan Chain Insertion We have been introduced to DFT, where it was shown that due to some man…
DFT | Fault models | Delay Faults Stuck-at, bridging & switching faults are a kind of a fault in which …
DFT | Fault models | Bridging Faults So far we have considered faults at the gate level & entirely dealt…
DFT | Fault models | Bridging Faults We have been dealing with different types of faults in out previous pos…